characterize
A simple circuit to let you characterize JFETs more accurately
In April 2012, EDN published a circuit by John Fattaruso that lets you quickly measure the drain-source saturation current and the pinch-off voltage of both an N-JFET and a P-JFET. The pinch-off voltage (Vp) is measured by inserting a very large resistance between the source and the ground. The drain-source saturation current (IDSS) is measured…