The world we are living in is increasingly becoming software-defined, where artificial intelligence (AI) is adding the next layer of functionality. And it’s driving the need for more compute to enable the software-enabled functionality. However, with this huge progression in compute content, Moore’s Law scaling will be insufficient to support the number of transistors for the needed compute.
Enter 3D ICs, disaggregating the functionality of silicon into a set of chiplets and then heterogeneously integrating them on an advanced integration platform. “Hyperscalers, driving the compute envelope, are particularly pushing the extreme where 3D ICs are needed,” said Michael White, VP of Calibre Design Solutions at Siemens EDA.
White also noted automotive designs where self-driving technology content is driving the need for 3D ICs. At the Design Automation Conference (DAC) held in San Francisco, California, on 22-25 June 2025, Siemens EDA announced two key additions to its EDA portfolio to address and overcome the complexity challenges associated with the design and manufacture of 2.5D and 3D IC devices.
First, the company’s Innovator3D IC suite enables chip designers to efficiently author, simulate, and manage heterogeneously integrated 2.5D and 3D IC designs. Second, its Calibre 3DStress software leverages advanced thermo-mechanical analysis to identify the electrical impact of stress at the transistor level.
Figure 1 The new tools aim to dramatically reduce risk and enhance the design, yield, and reliability of complex, next-generation 2.5D/3D IC designs. Source: Siemens EDA
“These solutions help designers achieve the needed compute performance while increasing yield and reliability and reducing cost,” White added. “They also offer the ability to leverage higher bandwidth between the chiplets placed on an interposer.” He calls this an inflection point in the design process and tools needed for the design flows.
Chiplet integration with Innovator3D IC
Keith Felton, principal technical product manager for 3D IC solutions at Siemens EDA, expanded on 3D IC being an inflection point, marking a transition from single design-centric approach to system-centric approach. “It impacts design flows and tools, necessitating a system-centric approach from early planning through final sign-off in four ways,” he added.
First, chip designers need system floor planning to optimize power, performance, area, and reliability across silicon, package, interposer, and even PCB. Second, they must start using multi-physics modeling to simulate complex thermo-mechanical interactions that impact electrical and structural performance.
Third, IC designers need to have a methodology for scalability to manage and communicate heterogeneous data across enterprise-wide teams and maintain digital continuity because there are hundreds of silicon designs encompassing chiplets. Fourth, designers must have a methodology for multi-die sign-off, enabling 3D verification of connectivity, interfaces, interconnect reliability, and electrostatic discharge (ESD) resiliency.
So, Innovator3D IC suite provides a fast, predictable path for planning and heterogeneous integration, substrate/interposer implementation, interface protocol analysis compliance and data management of designs, and design data IP.
Figure 2 Innovator3D IC suite facilitates design, verification, and data management of 2.5D and 3D IC chiplets. Source: Siemens EDA
Innovator3D IC—comprising four building blocks—offers an AI-infused user experience with extensive multithreading and multicore capabilities to achieve optimal capacity and performance on 5+ million pin designs. First, Innovator3D IC Integrator comes with a consolidated cockpit for constructing a digital twin, using a unified data model for design planning, prototyping, and predictive analysis.
Second, Innovator3D IC Layout facilitates correct-by-construction package interposer and substrate implementation. Third, Innovator3D IC Protocol Analyzer can be used for chiplet-to-chiplet and die-to-die interface compliance analysis. It’ll be critical in ensuring compliance with protocols such as Universal Chiplet Interconnect Express (UCIe). Finally, the Innovator3D IC Data Management part is targeted at the work-in-progress management of designs and design data IP.
“Innovator3D IC is targeting the optimization of 2.5 and 3D IC design performance to eliminate late-stage changes by enabling early prototyping and planning,” Felton said. “It accelerates compliance with protocols for chiplet integration and provides a core workflow that design teams need for 3D IC chiplet integration.”
Calibre 3DStress for package verification
Calibre 3DStress—the second part of Siemens EDA’s solution to streamline the design and analysis of complex, heterogeneously integrated 3D ICs—supports accurate, transistor-level analysis, verification, and debugging of thermo-mechanical stresses and warpage in the context of 3D IC packaging.
It enables IC designers to assess how chip-package interaction will impact the functionality of their designs earlier in the development cycle. Shetha Nolke, principal product manager for Calibre 3DStress at Siemens EDA, told EDN that this tool performs three key tasks for chip-package stress analysis in 3D IC designs.
First, stress simulation ensures accurate die levels under thermal and mechanical conditions. Second, what-if analysis optimizes IP, cell, or chip placement during early design stages. Third, it performs stress-aware circuit analysis using back annotation of device stress to minimize electrical impact.
Figure 3 With the thinner dies and higher package processing temperatures of 2.5D/3D IC architectures, designers often discovered that designs validated and tested at the die level no longer conform to specifications after packaging reflows. Source: Siemens EDA
3D ICs increasingly face stress- and warpage-related packaging challenges. That includes thermal challenges such as non-uniform heat generation and dissipation, which can result in higher temperatures and temperature gradients. Then, there are thermo-mechanical issues, where packaging process stages experience high temperature and fixed constraints.
Finally, thinned dies and ultra-low-k dielectrics increase mechanical stress-induced problems. “As multiple chiplets are integrated into a package, they experience thermal impacts because heat is not able to escape readily,” Nolke said. “While mechanical aspects are coming from incorporating package components, Calibre 3DStress can model it before fabrication.”
Calibre 3DStress delivers accurate die-level stress simulation using finite element analysis at a nano-meter feature scale. It also provides visualization of stress and warpage results while facilitating electrical and mechanical verification.
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